Xian Jin Xie: Goodness-Of-Fit Tests for Logistic Regression Models
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Author: Xian Jin Xie
Number of Pages: 166 pages
Published Date: 26 Oct 2013
Publisher: VDM Verlag Dr. Mueller e.K.
Publication Country: Saarbrucken, Germany
Language: English
ISBN: 9783639074321
Download Link: Click Here
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